==== ZU19’s VAUX mode on Trident Board: SEL evaluation at max operating temperature ====

Board Model Number:
  * 

Board ZCU Part Number: 
  * 

Operating Parameters:
  * HPIO-VCCO Rail Voltage
  * HPIO-

Test Results:
{{:data_analysis:2021-05-zcu-lbl0421runlog.ods|Runlog Trident ZU19 (mil-package, external current measurement)}}

Successful testing completed on 4/28/21 – 5/2/21 (40 total hours beam time)
  * Dozens of SELs (total) were observed with different ions: Neon, Argon, Xenon, and gold ( No SEL with Nitrogen)
  * Many SEL sites internally other than HPIO (LVAUX mode mitigated) or SysMon
  * SEL with LETs as low as 2.88 (neon)
    * Device temperature (imposed test condition): 110 C (or greater)
    * The predominant SEL signature (by far): Board showed Vccaux currents limited to 8.192A and shutdown the MPSoC
    * No destructive SELs were observed, but margin on shutdown time is not known
    * SEL rate calculation in progress – the rate needed for power cycling to clear them
    * Proton contribution will likely dominate rate calculation; hence measurements of proton susceptibility needed.

Based on these results, this ZU19 device can be used for HBTSS (Class C, 2 yr mission) with understanding of SEL rate (TBD) can be anywhere from ~1/week to 1/month.

=== List of to be expected signatures ===
Presented by Pierre (General meeting 2021-05-05):

awaiting approval 

=== Plan - ZU9’s on Xilinx ZCU102 Board ===

  * Neutron-irradiated devices evaluation for SEL mitigation 
  * Neutron irradiation reduces the gain of the parasitic bipolar transistors gain, and prevents device latchup

This neutron irradiated device testing to be conducted in 6/2/21 – (24 hours beam time).  
